Theory and Practice of SPM
This section comprises references to articles containing information on theoretical problems and fundamentals of Scanning Probe Microscopy issued mainly since 1996. Also, plenty of references to papers devoted to simulation and modeling experiments, as well as enhancements, improvements and developments of contemporary SPM methods and corresponding techniques are listed including those describing technical innovations and technological solutions.
We purposely do not engage in reviewing existent theories and models of SPM since such comprehensive and, on the other hand, highly specialized (in respect to every SPM method or technique) survey inevitably would inflate into a little book and should be performed by a group of persons whose experience in this field has been accumulated during the mature part of SPM history.
Most of the references to articles devoted to conceptual problems related to biology, AFM probes and AFM cantilevers are considered mainly in the appropriate sections of our Library and, as a rule, are not reflected here.
An attempt to classify different SPM methods and techniques probably has been undertaken by Friedbacher and Fuchs [1261], though some relatively well established techniques such as Conductive AFM (or Scanning Spreading Resistance Microscopy, SSRM) are not mentioned in this paper.
| ID | Reference list (newly come references are marked red) |
| 985 | A fast and versatile scan unit for scanning probe microscopy. Knebel D., Amrein M., Voigt K., Reichelt R. Scanning 19 (1997) 264-268. |
| 10 | A mechanical approach to the dissipation process in NC-AFM: experiments, model and simulation G. Couturier, J.P. Aime, J. Salardenne, R. Boisgard, A. Gourdon, S. Gauthier Applied Physics A: Materials Science & Processing, 72 (2001), 7, S47-S50 |
| 801 | A method to improve the quantitative analysis of SFM images at the nanoscale B.A. Todd, S.J. Eppell Surface Science, 491 (2001), 3, 473-483 |
| 802 | A metrological scanning force microscope X. Y., S.T. Smith, P.D. Atherton Precision Engineering, 19 (1996), 1, 46-55 |
| 803 | A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM) - A new approach to the measurement of adsorption isotherms at the solid-liquid interface G. Jordan, C.M. Eggleston Geochimica et Cosmochimica Acta, 62 (1998), 11, 1919-1923 |
| 270 | A tower-shaped prototypic molecule designed as an atomically sharp tip for AFM applications A.V. Rukavishnikov, M.D. Lee, A. Phadke, D.H. LaMunyo, P.A. Petukhov, J.F. Keana Tetrahedron Letters, 40 (1999), 35, 6353-6356 |
| 794 | Adhesion forces between individual ligand-receptor pairs Florin E-L., Moy V.T. and Gaub E.H. Science 264 (1994), 415-417 |
| 282 | AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann Thin Solid Films, 264 (1995), 2, 205-211 |
| 213 | AFM imaging with an xy-micropositioner with integrated tip P.-F. Indermuhle, V.P. Jaecklin, J. Brugger, C. Linder, N.F. De Rooij, M. Binggeli Sensors and Actuators A: Physical, 47 (1995), 1-3, 562-565 |
| 194 | AFM observations and simulations of jarosite growth at the molecular scale: probing the basis for the incorporation of foreign ions into jarosite as a storage mineral U. Becker, B. Gasharova Physics and Chemistry of Minerals, 28 (2001), 8, 545-556 |
| 1645 | Algorithms for scanned probe microscope image simulation, surface reconstruction, and tip estimation J. S. Villarrubia J. Res. Natl. Inst. Stand. Technol. 102, (1997), 4, 425-454 |
| 307 | Ambient atomic force microscopy images of stilbite and their interpretation by molecular simulations M. Komiyama, A. Miyamoto, Y. Oumi, M. Kubo, K. Tsujimichi Applied Surface Science, 121-122 (1997), 543-547 |
| 308 | Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials A. San Paulo, R. Garca Surface Science, 471 (2001), 1-3, 71-79 |
| 320 | AN02/DNP-hapten unbinding forces studied by molecular dynamics atomic force microscopy simulations B. Heymann, H. Grubmuller Chemical Physics Letters, 303 (1999), 1-2, 1-9 |
| 323 | Analytical evaluation of tapping mode atomic force microscopy for chemical imaging of surfaces B. Basnar, G. Friedbacher, H. Brunner, T. Vallant, U. Mayer, H. Hoffmann Applied Surface Science, 171 (2001), 3-4, 213-225 |
| 1008 | Application of neural networks to a scanning probe microscopy system L. Hadjiiski, R. Linnemann, M. Stopka, E. Oesterschulze, I. Rangelow, R. Kassing Thin Solid Films, 264 (1995), 2, 291-297 |
| 812 | Atomic and chemical resolution in scanning force microscopy on ionic surfaces A.L. Shluger, A.I. Livshits Applied Surface Science, 141 (1999), 3-4, 274-286 |
| 1638 | Atomic-force microscopy probe tip visualization and improvement of images using a simple deconvolution procedure P. Markiewicz and M. C. Goh Langmuir 10 (1994), 5 |
| 435 | Atomistic simulations of fluid structure and solvation forces in atomic force microscopy D.L. Patrick, R.M. Lynden-Bell Surface Science, 380 (1997), 2-3, 224-244 |
| 1011 | Automated detection of particles, clusters and islands in scanning probe microscopy images M.J.J. Jak, C. Konstapel, A. van Kreuningen, J. Verhoeven, R. van Gastel, J.W.M. Frenken Surface Science, 494 (2001), 2, 43-52 |
| 814 | Background correction in scanning probe microscope recordings of macromolecules J.P.P. Starink, T.M. Jovin Surface Science, 359 (1996), 1-3, 291-305 |
| 437 | Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy T. Arai, M. Tomitori Applied Surface Science, 157 (2000), 4, 207-211 |
| 817 | Bridge configuration of piezoresistive devices for scanning force microscopes O. Ohlsson, J. Schelten, R. Jumpertz, F. Saurenbach Sensors and Actuators A: Physical, 70 (1998), 1-2, 88-91 |
| 1104 | Calculation of playback signals from MFM images using transfer functions S.J.L. Vellekoop, J.J. Miles, J.C. Lodder, L. Abelmann, S. Porthun Journal of Magnetism and Magnetic Materials, 193 (1999), 1-3, 474-478 |
| 438 | Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy S. Hembacher, H. Bielefeldt, F.J. Giessibl, J. Mannhart Applied Surface Science, 140 (1999), 3-4, 352-357 |
| 1012 | Calibration of transfer standards for SPM L. Koenders, G.-S. Peng, Gao-Feng Microelectronic Engineering, 41-42 (1998), 615-618 |
| 820 | Characterization of an integrated force sensor based on a MOS transistor for applications in scanning force microscopy N.F. De Rooij, J. Brugger, A. Tonin, P. Vettiger, T. Akiyama, U. Staufer, H.-R. Hidber Sensors and Actuators A: Physical, 64 (1998), 1, 1-6 |
| 1261 | Classification of Scanning Probe Microscopies Gernot Friedbacher and Harald Fuchs Pure Appl. Chem., 71 (1999), 7, pp. 1337-1357 |
| 1108 | Comparing the resolution of magnetic force microscopes using the CAMST reference samples L. Abelmann, B. Stiefel, K. Babcock, P.J.A. van Schendel, R. Proksch, H.J. Hug, M.E. Best, A. Farley, C. Lodder, M. Haast, T. Pfaffelhuber, G.P. Heydon, A. Moser, S.R. Hoon, S. Porthun Journal of Magnetism and Magnetic Materials, 190 (1998), 1-2, 135-147 |
| 1635 | Computational model of the imaging process in scanning-x microscopy H. Gallarda and R. Jain Proceedings of Conference on Integrated Circuit Metrology, Inspection, and Process Control, V, SPIE Vol. 1464 (1991), 459. |
| 22 | Contact resonance imaging - a simple approach to improve the resolution of AFM for biological and polymeric materials K. Wadu-Mesthrige, N.A. Amro, J.C. Garno, S. Cruchon-Dupeyrat, G.-Y. Liu Applied Surface Science, 175-176 (2001), 391-398 |
| 7 | Contrast inversion in nc-AFM on Si(111)7x7 due to short-range electrostatic interactions M. Guggisberg, O. Pfeiffer, S. Schar, V. Barwich, M. Bammerlin, C. Loppacher, R. Bennewitz, A. Baratoff, E. Meyer Applied Physics A: Materials Science & Processing, 72 (2001), 7, S19-S22 |
| 38 | Contrast mechanism in non-contact AFM on reactive surfaces K. Terakura, R. Perez, I. Stich, M.C. Payne Applied Surface Science, 123-124 (1998), 249-254 |
| 824 | Contrast mechanism in non-contact SFM imaging of ionic surfaces A.I. Livshits, A.L. Shluger, A.L. Rohl Applied Surface Science, 140 (1999), 3-4, 327-332 |
| 463 | Corrections to the van der Waals forces in application to atomic force microscopy M. Bordag, G.L. Klimchitskaya, V.M. Mostepanenko Surface Science, 328 (1995), 1-2, 129-134 |
| 465 | Correlation between frequency-sweep hysteresis and phase imaging instability in tapping mode atomic force microscopy G. Bar, R. Brandsch, M.-H.M.-H. Whangbo Surface Science, 436 (1999), 1-3, L715-L723 |
| 973 | Deformation, contact time, and phase-contrast in tapping mode scanning force microscopy Tamayo J., Garcia R. Langmuir 12 (1996), 4430-4435 |
| 830 | Dependence of the measured monolayer height on applied forces in scanning force microscopy X.D. Liu, M. Hartig, L.F. Chi, H. Fuchs Thin Solid Films, 327-329 (1998), 262-267 |
| 1110 | Description of magnetic force microscopy by three-dimensional tip Green's function for sample magnetic charges H. Saito, S. Ishio, J. Chen Journal of Magnetism and Magnetic Materials, 191 (1999), 1-2, 153-161 |
| 468 | Description of phase imaging in tapping mode atomic force microscopy by harmonic approximation M.-H. Whangbo, R. Brandsch, G. Bar Surface Science, 411 (1998), 1-2, L794-L801 |
| 469 | Design and application of scanning near-field optical/atomic force microscopy T. Ataka, H. Muramatsu, K. Nakajima, N. Chiba, K. Homma, M. Fujihara Thin Solid Films, 273 (1996), 1-2, 154-160 |
| 1604 | Determining the form of atomic force microscope tips P. Siedle, H-J. Butt. E.Bamberg, D.N. Wang, W. Kuhlbrand, J. Zach and M. Haider Int. Phys. Conf. Ser. 130 (1993) 361 |
| 499 | Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements L. Delineau, G. Bar, R. Brandsch, M. Bruch, M.-H. Whangbo Surface Science, 444 (2000), 1-3, L11-L16 |
| 75 | Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing M. Baba, S. Kakitani, H. Ishii, T. Okuno Chemical Physics, 221 (1997), 1-2, 23-31 |
| 504 | Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation R.W. Stark, W.M. Heckl Surface Science, 457 (2000), 1-2, 219-228 |
| 1023 | Fractal analysis of scanning probe microscopy images N. Almqvist Surface Science, 355 (1996), 1-3, 221-228 |
| 507 | Frequency modulation detection atomic force microscopy in the liquid environment S.P. Jarvis, T. Ishida, T. Uchihashi, Y. Nakayama, H. Tokumoto Applied Physics A: Materials Science & Processing, 72 (2001), 7, S129-S132 |
| 508 | Frequency shift and energy dissipation in non-contact atomic-force microscopy S.H. Ke, T. Uda, K. Terakura Applied Surface Science, 157 (2000), 4, 361-366 |
| 518 | Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy Y. Sugawara, S. Morita Applied Surface Science, 140 (1999), 3-4, 406-410 |
| 519 | Harmonic responses of a cantilever interacting with elastomers in tapping mode atomic force microscopy M.-H. Whangbo, G. Bar, R. Brandsch, L. Delineau Surface Science, 448 (2000), 1, L179-L187 |
| 250 | How to describe AFM constant force surfaces in repulsive mode? E.V. Blagov, G.L. Klimchitskaya, A.A. Lobashov, V.M. Mostepanenko Surface Science, 349 (1996), 2, 196-206 |
| 524 | How to measure energy dissipation in dynamic mode atomic force microscopy H. Fuchs, V.B. Elings, B. Anczykowski, J.P. Cleveland, B. Gotsmann Applied Surface Science, 140 (1999), 3-4, 376-382 |
| 45 | Imaging of chemical reactivity and buckled dimers on Si(100)2x1 reconstructed surface with noncontact AFM T. Tsukamoto, T. Okada, T. Minobe, Y. Sugawara, T. Uchihashi, S. Orisaka, S. Morita Applied Surface Science, 140 (1999), 3-4, 304-308 |
| 8 | Imaging problems on insulators: What can be learnt from NC-AFM modelling on CaF2 A.S. Foster, A.L. Rohl, A.L. Shluger Applied Physics A: Materials Science & Processing, 72 (2001), 7, S31-S34 |
| 225 | Impact of atomic relaxation on the breaks of constant force surfaces in AFM E.V. Blagov, G.L. Klimchitskaya, V.M. Mostepanenko Surface Science, 410 (1998), 2-3, 158-169 |
| 14 | Instrumentation of STM and AFM combined with transmission electron microscope D. Erts, A. Lohmus, R. Lohmus, H. Olin Applied Physics A: Materials Science & Processing, 72 (2001), 7, S71-S74 |
| 52 | Interaction measurements between a tip and a sample in proximity regions controlled by tunneling current in a UHV STM-AFM M. Tomitori, T. Arai Applied Surface Science, 144-145 (1999), 501-504 |
| 837 | Intercomparison of SEM, AFM, and Electrical Linewidths J. S. Villarrubia, R. Dixson, S. Jones, J. R. Lowney, M. T. Postek, R. A. Allen, and M. W. Cresswell Metrology, Inspection, and Process Control for Microlithography XIII, Proc. SPIE 3677 (1999), pp. 587-598 |
| 1308 | Lateral force microscopy - A quantitative approach G.S. Watson, S. Myhra, C.T. Gibson Wear, 213 (1997), 1-2, 72-79 |
| 786 | Limits of force microscopy Smith, D.P.E. Rev. Sci. Instrum. 66 (1995), 3191-3195 |
| 1033 | Melnikov-Based Dynamical Analysis of Microcantilevers in Scanning Probe Microscopy M. Ashhab, M. V. Salapaka, M. Dahleh, I. Mezic Nonlinear Dynamics, 20 (1999), 3, 197-220 |
| 1603 | Mesoscopic Calibration of an Atomic Force Microscope S.S. Sheiko, M. Moller, E.M.C.M. Reuvekamp and H.W. Zandbergen Ultramicroscopy 53 (1994) 371-380 |
| 231 | Model dependence of AFM simulations in non-contact mode I.Y. Sokolov, G.S. Henderson, F.J. Wicks Surface Science, 457 (2000), 1-2, 267-272 |
| 612 | Molecular dynamics simulation of atomic force microscopy: imaging single-atom vacancies on Ag(001) and Pt(001) M. Katagiri, R.M. Lynden-Bell, D.L. Patrick Surface Science, 431 (1999), 1-3, 260-268 |
| 881 | Molecular dynamics study of scanning force microscopy on self-assembled monolayers T. Bonner, A. Baratoff Surface Science, 377-379 (1997), 1082-1086 |
| 632 | Nanoparticle sizing: a comparative study using atomic force microscopy, transmission electron microscopy, and ferromagnetic resonance L.M. Lacava, B.M. Lacava, R.B. Azevedo, Z.G.M. Lacava, N. Buske, A.L. Tronconi, P.C. Morais Journal of Magnetism and Magnetic Materials, 225 (2001), 1-2, 79-83 |
| 318 | Normal and lateral force investigation using magnetically activated force sensors S.P. Jarvis, H. Yamada, K. Kobayashi, A. Toda, H. Tokumoto Applied Surface Science, 157 (2000), 4, 314-319 |
| 1450 | Novel nanoindentation method for characterising multiphase materials N.X. Randall, C. Julia-Schmutz, J.M. Soro, J. von Stebut, G. Zacharie Thin Solid Films, 308-309 (1997), 1-4, 297-303 |
| 656 | Observation of voltage contrast in non contact resonant mode Atomic Force Microscopy P. Girard, G.C. Solal, S. Belaidi Microelectronic Engineering, 31 (1996), 1-4, 215-225 |
| 659 | On possibility of spin-polarized atomic force microscopy H.J. Reittu Surface Science, 334 (1995), 1-3, 257-262 |
| 664 | Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy R. Nishi, I. Houda, T. Aramata, Y. Sugawara, S. Morita Applied Surface Science, 157 (2000), 4, 332-336 |
| 665 | Phase imaging and stiffness in tapping-mode atomic force microscopy M.-H. Whangbo, S.N. Magonov, V. Elings Surface Science, 375 (1997), 2-3, l385-l391 |
| 32 | Phase imaging as an extension to tapping mode AFM for the identification of material properties on humidity-sensitive surfaces I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer Applied Surface Science, 115 (1997), 2, 190-198 |
| 1452 | Progress in determination of the area function of indenters used for nanoindentation K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, R. Seemann Thin Solid Films, 377-378 (2000), 394-400 |
| 156 | Proposal for new atomic force microscopy (AFM) imaging for a high aspect structure (digital probing mode AFM) S. Hosaka, T. Morimoto, K. Kuroda, H. Kunitomo, T. Hiroki, T. Kitsukawa, S. Miwa, H. Yanagimoto, K. Murayama Microelectronic Engineering, 57-58 (2001), 651-657 |
| 48 | Pseudo-non-contact AFM imaging? F.J. Wicks, G.S. Henderson, I.Y. Sokolov Applied Surface Science, 140 (1999), 3-4, 362-365 |
| 62 | Quantitative electrostatic force measurement in AFM S. Jeffery, A. Oral, J.B. Pethica Applied Surface Science, 157 (2000), 4, 280-284 |
| 221 | Quantum oscillations in surface-tip transfer of adatoms on AFM/STM with a dissipative environment I.S. Tilinin, M.A. Van Hove, M. Salmeron Surface Science, 393 (1997), 1-3, l88-l92 |
| 897 | Resonance modes of voltage-modulated scanning force microscopy M. Labardi, V. Likodimos, M. Allegrini Applied Physics A: Materials Science & Processing, 72 (2001), 7, S79-S85 |
| 1636 | Restoration of scanning probe microscope images G. S. Pingali and R. Jain Proceedings IEEE Workshop on Applications of Computer Vision, (1992) pp. 282-289. |
| 251 | Role of the adhesion between a nanotip and a soft material in tapping mode AFM F. Dubourg, J.P. Aime Surface Science, 466 (2000), 1-3, 137-143 |
| 898 | Role of the force of friction on curved surfaces in scanning force microscopy J.P. Aime, Z. Elkaakour, S. Gauthier, D. Michel, T. Bouhacina, J. Curely Surface Science, 329 (1995), 1-2, 149-156 |
| 29 | Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements J.C. Arnault, A. Knoll, E. Smigiel, A. Cornet Applied Surface Science, 171 (2001), 3-4, 189-196 |
| 984 | Scan speed limit in atomic force microscopy Butt H.J., Siedle P., Seifert K., Fendler K., Seeger T., Bamberg E., Weisenhorn A.L., Goldie K., Engel A. J. Microsc. 169 (1993), 75-84 |
| 916 | Scanning force microscopy simulations of well-characterized nanostructures on dielectric and semiconducting substrates G. Cohen-Solal, F. Touhari, X. Bouju, M. Devel, C. Girard Applied Surface Science, 125 (1998), 3-4, 351-359 |
| 1633 | Scanning tunneling microscopy on rough surfaces-deconvolution of constant current images G. Reiss, F. Schneider, J. Vancea, and H. Hoffmann Appl. Phys. Lett. 57, (1990), 867 |
| 63 | Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM A. Nakasa, U. Akiba, M. Fujihira Applied Surface Science, 157 (2000), 4, 326-331 |
| 921 | Self-excited force-sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy T. Itoh, T. Suga Sensors and Actuators A: Physical, 54 (1996), 1-3, 477-481 |
| 30 | Simulated nc-AFM images of Si(001) surface with nanotube tip K. Tagami, N. Sasaki, M. Tsukada Applied Surface Science, 172 (2001), 3-4, 301-306 |
| 245 | Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging M. Komiyama, K. Tsujimichi, K. Tazawa, A. Hirotani, H. Yamano, A. Miyamoto, E. Broclawik, M. Kubo Surface Science, 357-358 (1996), 222-227 |
| 698 | Simulation of atomic force microscopy image variations due to tip apex size: Appearance of half spots M. Komiyama, K. Tazawa, K. Tsujimichi, A. Hirotani, M. Kubo, A. Miyamoto Thin Solid Films, 281-282 (1996), 1-2, 580-583 |
| 243 | Simulation of interaction force between Si tip and Si(111)√3×√3-Ag surface of IET structure in noncontact AFM N. Sasaki, S. Watanabe, H. Aizawa, M. Tsukada Surface Science, 493 (2001), 1-3, 188-193 |
| 9 | Simulation of NC-AFM images of xenon(111) H. Holscher, W. Allers, U.D. Schwarz, A. Schwarz, R. Wiesendanger Applied Physics A: Materials Science & Processing, 72 (2001), 7, S35-S38 |
| 11 | Simultaneous imaging of tunneling current and damping energy by noncontact-AFM in ultra-high vacuum T. Arai, M. Tomitori Applied Physics A: Materials Science & Processing, 72 (2001), 7, S51-S54 |
| 927 | Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface A.S. Foster, A.L. Shluger Surface Science, 490 (2001), 1-2, 211-219 |
| 929 | Strength measurement and calculations on silicon-based nanometric oscillators for scanning force microcopy operating in the gigahertz range H. Kawakatsu, H. Toshiyoshi, D. Saya, K. Fukushima, H. Fujita Applied Surface Science, 157 (2000), 4, 320-325 |
| 972 | Studies of vibrating atomic force microscope cantilevers in liquid Schaeffer T.E., Cleveland J.P., Ohnesorge F.M., Walters D.A., Hansma P.K. J Appl Phys 80 (1996), 3622-3627. |
| 933 | Study of tip-sample interaction in scanning force microscopy M. Luna, J. Colchero, J. Gomez-Herrero, A.M. Baro Applied Surface Science, 157 (2000), 4, 285-289 |
| 1070 | Surface analysis algorithms for scanning probe microscopy C. Lindquist, F.K. Urban, C.S. Lindquist, F.K.I. Urban Thin Solid Films, 270 (1995), 1-2, 399-405 |
| 938 | Surface roughness of thin layers - A comparison of XRR and SFM measurements Z. Stachura, M. Lekka, O. Filies, J. Lekki, O. Boling, K. Grewer, B. Cleff Applied Surface Science, 141 (1999), 3-4, 357-365 |
| 233 | The contrast mechanism for true atomic resolution by AFM in non-contact mode: Quasi-non-contact mode? I.Y. Sokolov, G.S. Henderson, F.J. Wicks Surface Science, 381 (1997), 1, l558-l562 |
| 244 | The height dependence of image contrast when imaging by non-contact AFM I.Y. Sokolov, G.S. Henderson Surface Science, 464 (2000), 2-3, L745-L751 |
| 12 | The measurement of hysteretic forces by dynamic AFM B. Gotsmann, H. Fuchs Applied Physics A: Materials Science & Processing, 72 (2001), 7, S55-S58 |
| 766 | The role of damping in phase imaging in tapping mode atomic force microscopy L. Wang Surface Science, 429 (1999), 1-3, 178-185 |
| 950 | The role of shear forces in scanning force microscopy: a comparison between the jumping mode and tapping mode F. Moreno-Herrero, P.J. de Pablo, J. Colchero, J. Gomez-Herrero, A.M. Baro Surface Science, 453 (2000), 1-3, 152-158 |
| 769 | Theoretical analysis of atomic-scale friction infrictional-force microscopy N. Sasaki, M. Tsukada, S. Fujisawa, Y. Sugawara, S. Morita Tribology Letters, 4 (1998), 2, 125-128 |
| 770 | Theoretical evaluation of the frequency shift and dissipated power in noncontact atomic force microscopy N. Sasaki, M. Tsukada Applied Physics A: Materials Science & Processing, 72 (2001), 7, S39-S42 |
| 771 | Theoretical simulation of atomic-scale friction in atomic force microscopy N. Sasaki, K. Kobayashi, M. Tsukada Surface Science, 357-358 (1996), 92-95 |
| 64 | Theoretical simulation of noncontact AFM images of Si(111)√3×√3-Ag surface based on Fourier expansion method N. Sasaki, H. Aizawa, M. Tsukada Applied Surface Science, 157 (2000), 4, 367-372 |
| 47 | Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM N. Sasaki, M. Tsukada Applied Surface Science, 140 (1999), 3-4, 339-343 |
| 775 | Time-frequency modeling of atomic force microscopy D. Dragoman, M. Dragoman Optics Communications, 140 (1997), 4-6, 220-225 |
| 1362 | STM studies: spatial resolution limits to fit observations in nanotechnology P. D. Szkutnik, A. Piednoir, A. Ronda, F. Marchi, D. Tonneau, H. Dallaporta, M. Hanbucken Applied Surface Science 164 (2000) 169-174 |
| 1324 | Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy Y. H. Liau, N. F. Scherer Appl. Phys. Lett. 74 (1999), 26, pp. 3966-3968 |
| 1326 | High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork F.J.Giessibl Appl. Phys. Lett. 74 (1999), 26, p. 4070 |
| 1327 | The influence of Coulomb interaction of localized charges on low-temperature scanning tunnelling spectra of surface nanodefects Maslova N.S. Oreshkin A.I., Oreshkin S.I., Panov V.I., Savinov S.V., Kalachev A.A. J. Phys.: Cond. Matter 13 (2001) 18, 3941-3948 |
| 1331 | Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs Applied Surface Science 140 (1999) 314-319 |
| 1332 | Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip-microlever system near a surface R. Boisgard, D. Michel, J.P. Aimé Surface Science 401 (1998) 199-205 |
| 1333 | Scanning tunneling microscope-induced molecular motion and its effect on the image formation Matthias Böhringer, Wolf-Dieter Schneider, Richard Berndt Surface Science 408 (1998) 72-85 |
| 1334 | The use of macros in AFM image analysis and image processing Barrett S. D., Bickmore B. R., Rufe E., Hochella M. F., Torzo G. and Cerolini. D J. Comp. Ass. Microsc. 10 (1998), 77 |
| 1338 | Atomic force microscope for direct comparison measurement of step height and crystalline lattice spacing T. Fujii, K. Imabori, H. Kawakatsu, Sh. Watanabe and H. Bleuler Nanotechnology 10 (1999) 380-384 |
| 1345 | Imitation of non-contact mode while scanning in the presence of an electric double layer? I. Yu. Sokolov, G.S. Henderson, F. J. Wicks Applied Surface Science 140 (1999) 422-427 |
| 1346 | Theoretical and experimental evidence for "true" atomic resolution under non-vacuum conditions I. Yu. Sokolov, G.S. Henderson, F. J. Wicks J. Appl. Phys. 86 (1999) 10, 5537-5540 |
| 1358 | Sensitivity of vibration modes of atomic force microscope cantilevers in continuous surface contact Win-Jin Chang Nanotechnology 13 (2002) 510-514 |
| 1362 | STM studies: spatial resolution limits to fit observations in nanotechnology P. D. Szkutnik, A. Piednoir, A. Ronda, F. Marchi, D. Tonneau, H. Dallaporta, M. Hanbucken Applied Surface Science 164 (2000) 169-174 |
| 1366 | Measuring discrete feature dimensions in atomic force microscopy images with Image SXM Bickmore B. R., Rufe E., Barrett S. D. and Hochella M. F. Geol. Mater. Res. 1 (1999), 5 (http://gmr.minsocam.org/ papers/v1/v1n5/v1n5abs.html) |
| 1368 | Opening and viewing image data files Entwistle A. Proc. Roy. Microsc. Soc. 36 (2001), 101 |
| 1375 | A relocated technique of atomic force microscopy (AFM) samples and its application in molecular biology Aiguo Wu, Zhuang Li, Lihua Yu, Hongda Wang and Erkang Wang Ultramicroscopy, Vol. 92 (3-4) (2002) pp. 201-207 |
| 1377 | Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers X.D. Cui, X. Zarate, J. Tomfohr, A. Primak, A.L. Moore, T.A. Moore, D. Gust, G. Harris, O.F. Sankey and S.M. Lindsay Ultramicroscopy, Vol. 92 (2) (2002) pp. 67-76 |
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