Atomic Force Microscopy (AFM) Library by MikroMasch

By now Scanning Probe Microscopy family comprises dozens of techniques and modes, which are applied successfully to various fields of science, industry and education. The widespread use of Scanning Probe Microscopy in few recent years is evidenced by growing number of publications.

These pages contain the most relevant information on SPM-related problems in the form of brief reviews. Abundant bibliography comprising about 2500 references reflects the versatility of Scanning Probe Microscopy and the variety of its applications.

This section is intended to help our customers and those who are interested or engaged in Scanning Probe Microscopy investigations to navigate in the world of SPM.

Please, send all comments and suggestions concerning the pages to info@mikromasch.com.