Test Structures
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PA Series
Samples for reverse imaging of AFM tips and characterization of AFM tip shape
TGXYZ SeriesGratings for vertical and lateral calibration of SPM. Arrays of silicon oxide structures
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TGX Series
Silicon gratings for AFM tip aspect ratio determination and lateral calibration of SPMs
TGF11 SeriesSilicon gratings for lateral force calibration and scanner nonlinearity assessment
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HOPG
Highly ordered pyrolytic graphite with atomically flat areas - AFM sample substrate