ScanAsyst®* Mode

PeakForce Tapping™* is an advanced Atomic Force Microscopy (AFM) technique that enables high-resolution surface property measurements with minimal contact force. It combines the benefits of traditional tapping mode with precise force control for enhanced imaging and analysis. The ScanAsyst® algorithm further improves PeakForce Tapping™* by automating scan parameter selection and optimization.

PeakForce Tapping™* precisely regulates the force applied by the AFM tip at each contact point, reducing sample deformation and minimizing the risk of damage. This controlled, low-force operation enhances image resolution and preserves delicate surfaces, making it ideal for soft materials such as biological samples, polymers, and nanomaterials. Additionally, it provides accurate topography and quantitative mechanical property measurements, such as stiffness, adhesion and deformation.

ScanAsyst®* simplifies AFM operation by automatically adjusting parameters such as oscillation amplitude and feedback settings. This eliminates the need for manual tuning, optimizing imaging conditions and improving efficiency for users.

Bruker’s Tip Qualification module is used to assess the sharpness of a SelfAdjust-Air AFM tip based on a scan of the MikroMasch PA01 AFM tip evaluation sample.