HQ:XSC11/Pt
AFM Probe with 4 Different Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Coating
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.2 N/m(0.1 - 0.4 N/m)* | Res. Freq. 15 kHz(12 - 18 kHz)* | Length 500 µm(1 - 505µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 2.7 N/m(1.1 - 5.6 N/m)* | Res. Freq. 80 kHz(60 - 100 kHz)* | Length 210 µm(1 - 215µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 7 N/m(3 - 16 N/m)* | Res. Freq. 155 kHz(115 - 200 kHz)* | Length 150 µm(1 - 155µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever D | Shape Beam | Force Const. 42 N/m(17 - 90 N/m)* | Res. Freq. 350 kHz(250 - 465 kHz)* | Length 100 µm(1 - 105µm)* | Width 50 µm(47 - 53µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
* typical values
