HQ:NSC36/Pt
AFM Probe with 3 Different Conductive Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Coating
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 1 N/m(0.1 - 4.6 N/m)* | Res. Freq. 90 kHz(30 - 160 kHz)* | Length 110 µm(1 - 115µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 2 N/m(0.2 - 9 N/m)* | Res. Freq. 130 kHz(45 - 240 kHz)* | Length 90 µm(1 - 95µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 0.6 N/m(0.06 - 2.7 N/m)* | Res. Freq. 65 kHz(25 - 115 kHz)* | Length 130 µm(1 - 135µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
* typical values
