HQ:NSC36/Co-Cr/Al BS
Magnetic AFM Probe with 3 Different AFM Cantilevers
AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The coating consists of a cobalt layer on the tip side and an aluminum reflective layer on the back side of the AFM cantilevers. The cobalt layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis.
All AFM probes are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB. The cobalt coating is protected from oxidation by a thin chromium layer, resulting in longer AFM tip lifetime. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times.
Magnetic
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 60 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 1 N/m(0.1 - 4.6 N/m)* | Res. Freq. 60 kHz(30 - 160 kHz)* | Length 110 µm(1 - 115µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 2 N/m(0.2 - 9 N/m)* | Res. Freq. 130 kHz(45 - 240 kHz)* | Length 90 µm(1 - 95µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 0.6 N/m(0.06 - 2.7 N/m)* | Res. Freq. 65 kHz(25 - 115 kHz)* | Length 130 µm(1 - 135µm)* | Width 32.5 µm(29.5 - 35.5µm)* | Thickness 1µm(0.5 - 1.5 µm)* |
* typical values
