HQ:NSC35/No Al
AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers
AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
Coating
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 8.9 N/m(2.7 - 24 N/m)* | Res. Freq. 205 kHz(130 - 290 kHz)* | Length 110 µm(1 - 115µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 16 N/m(4.8 - 44 N/m)* | Res. Freq. 300 kHz(185 - 430 kHz)* | Length 90 µm(1 - 95µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 5.4 N/m(1.7 - 14 N/m)* | Res. Freq. 150 kHz(95 - 205 kHz)* | Length 130 µm(1 - 135µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
* typical values
