HQ:NSC16/Pt
Conductive Tapping Mode AFM Probe with Long AFM Cantilever
AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.
Electrically Conductive
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 30 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 45 N/m(30 - 70 N/m)* | Res. Freq. 190 kHz(170 - 210 kHz)* | Length 225 µm(1 - 230µm)* | Width 37.5 µm(34.5 - 40.5µm)* | Thickness 7µm(6.5 - 7.5 µm)* |
* typical values
