HQ:NSC15/Hard/Al BS
Long Scanning, DLC Hardened Tapping Mode AFM Probe
AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
A 20 nm wear-resistant DLC coating is applied to the tip side of the AFM cantilever. The coating is chemically inert and more hydrophobic than silicon with a natural oxide layer. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times.
Hard Diamond-Like-Carbon
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 20 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 40 N/m(20 - 80 N/m)* | Res. Freq. 325 kHz(265 - 410 kHz)* | Length 125 µm(1 - 130µm)* | Width 30 µm(27 - 33µm)* | Thickness 4µm(3.5 - 4.5 µm)* |
* typical values
