HQ:NSC14/No Al
Soft Tapping Mode AFM Probe
AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
Coating
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 5 N/m(1.8 - 13 N/m)* | Res. Freq. 160 kHz(110 - 220 kHz)* | Length 125 µm(1 - 130µm)* | Width 25 µm(22 - 28µm)* | Thickness 2.1µm(1.6 - 2.6 µm)* |
* typical values
