HQ:DPER-XSC11
AFM Probe with 4 Different High Resolution Conductive AFM Cantilevers
AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall platinum coating is electrically conductive and chemically inert. The thickness of the DPER tip side coating is about 15 nm on the flat cantilever surface, resulting in a coated AFM tip radius below 20 nm. The AFM probes can be used for imaging samples with higher resolution in XY directions.
Electrically Conductive
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 20 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.2 N/m(0.1 - 0.4 N/m)* | Res. Freq. 15 kHz(12 - 18 kHz)* | Length 500 µm(1 - 505µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 2.7 N/m(1.1 - 5.6 N/m)* | Res. Freq. 80 kHz(60 - 100 kHz)* | Length 210 µm(1 - 215µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 7 N/m(3 - 16 N/m)* | Res. Freq. 155 kHz(115 - 200 kHz)* | Length 150 µm(1 - 155µm)* | Width 30 µm(27 - 33µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
| Cantilever Cantilever D | Shape Beam | Force Const. 42 N/m(17 - 90 N/m)* | Res. Freq. 350 kHz(250 - 465 kHz)* | Length 100 µm(1 - 105µm)* | Width 50 µm(47 - 53µm)* | Thickness 2.7µm(2.2 - 3.2 µm)* |
* typical values
