HQ:CSC37/Pt
AFM Probe with 3 Different Conductive Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilevers. The resulting coated AFM tip radius is below 30 nm.
Coating
Electrically Conductive
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 30 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.8 N/m(0.3 - 2 N/m)* | Res. Freq. 40 kHz(30 - 55 kHz)* | Length 250 µm(1 - 255µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 0.3 N/m(0.1 - 0.6 N/m)* | Res. Freq. 20 kHz(15 - 30 kHz)* | Length 350 µm(1 - 355µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 0.4 N/m(0.1 - 1 N/m)* | Res. Freq. 30 kHz(20 - 40 kHz)* | Length 300 µm(1 - 305µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
* typical values
