HQ:CSC37/No Al
AFM Probe with 3 Different Contact Mode AFM Cantilevers
AFM probes of the HQ:CSC37 series have three different contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
Coating
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.8 N/m(0.3 - 2 N/m)* | Res. Freq. 40 kHz(30 - 55 kHz)* | Length 250 µm(1 - 255µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever B | Shape Beam | Force Const. 0.3 N/m(0.1 - 0.6 N/m)* | Res. Freq. 20 kHz(15 - 30 kHz)* | Length 350 µm(1 - 355µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
| Cantilever Cantilever C | Shape Beam | Force Const. 0.4 N/m(0.1 - 1 N/m)* | Res. Freq. 30 kHz(20 - 40 kHz)* | Length 300 µm(1 - 305µm)* | Width 35 µm(32 - 38µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
* typical values
