HQ:CSC17/Pt

Conductive Contact Mode AFM Probe


AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

The overall 30 nm platinum coating is electrically conductive and chemically inert. It also enhances the laser reflectivity of the AFM cantilever. The resulting coated AFM tip radius is below 30 nm.

Coating

Electrically Conductive

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 30 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 0.18 N/m(0.06 - 0.4 N/m)* Res. Freq. 13 kHz(10 - 17 kHz)* Length 450 µm(1 - 455µm)* Width 50 µm(47 - 53µm)* Thickness 2µm(1.5 - 2.5 µm)*

* typical values

Packages Price
HQ:CSC17/Pt-15 15 pcs * 395 USD
395 USD
HQ:CSC17/Pt-50 50 pcs * 1120 USD
1120 USD
HQ:CSC17/Pt-100 100 pcs * 2050 USD
2050 USD
* Total: 0 USD
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