Hi'Res-C15/Cr-Au
High Resolution, Tapping Mode AFM Probe
The high-resolution AFM probes of the Hi'Res-C series feature a hydrophobic diamond-like spike at the apex of the silicon etched AFM tip.
AFM probes of the HQ:NSC15 series have AFM cantilevers with high stability in tapping mode and non-contact mode operation.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
The overall 30 nm Au coating with 20 nm Cr sublayer is chemically inert. It also ehnances the laser reflectivity of the AFM cantilever in air and liquids. The coating does not cover the spike.
Reflective Gold
| Shape | Height | Radius |
|---|---|---|
| Shape Supersharp | Height 15 µm (12 - 18 µm)* | Radius < 1 nm |
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 40 N/m(20 - 80 N/m)* | Res. Freq. 325 kHz(265 - 410 kHz)* | Length 125 µm(1 - 130µm)* | Width 30 µm(27 - 33µm)* | Thickness 4µm(3.5 - 4.5 µm)* |
* typical values
