HQ:NSC15/No Al

Standard Tapping Mode AFM Probe


AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

Coating

none

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 8 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 40 N/m(20 - 80 N/m)* Res. Freq. 325 kHz(265 - 410 kHz)* Length 125 µm(1 - 130µm)* Width 30 µm(27 - 33µm)* Thickness 4µm(3.5 - 4.5 µm)*

* typical values

Packages Price
HQ:NSC15/No Al-15 15 pcs * 320 USD
320 USD
HQ:NSC15/No Al-50 50 pcs * 900 USD
900 USD
HQ:NSC15/No Al-100 100 pcs * 1700 USD
1700 USD
HQ:NSC15/No Al-200 200 pcs * 3200 USD
3200 USD
HQ:NSC15/No Al-400 400 pcs * 4990 USD
4990 USD
* Total: 0 USD
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