HQ:CSC17/No Al
Contact Mode AFM Probe
AFM probes of the HQ:CSC17 series have AFM cantilevers with low force constants that offer high sensitivity in contact mode AFM. These AFM probes are also used for Lateral Force Microscopy.
The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.
Coating
none
AFM Probe Specifications
AFM Tip
| Shape | Height | Full Cone Angle | Radius |
|---|---|---|---|
| Shape Rotated | Height 15 µm (12 - 18 µm)* | Full Cone Angle 40° | Radius < 8 nm |
AFM Cantilever
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Cantilever A | Shape Beam | Force Const. 0.18 N/m(0.06 - 0.4 N/m)* | Res. Freq. 13 kHz(10 - 17 kHz)* | Length 450 µm(1 - 455µm)* | Width 50 µm(47 - 53µm)* | Thickness 2µm(1.5 - 2.5 µm)* |
* typical values
