HQ:NSC19/No Al

Soft Tapping Mode and LFM AFM Probe


AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces.

The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor.

* ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corporation

Coating

none

AFM Probe Specifications
AFM Tip
Shape Height Full Cone Angle Radius
Shape Rotated Height 15 µm (12 - 18 µm)* Full Cone Angle 40° Radius < 8 nm
AFM Cantilever
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever Cantilever A Shape Beam Force Const. 0.5 N/m(0.05 - 2.3 N/m)* Res. Freq. 65 kHz(25 - 120 kHz)* Length 125 µm(1 - 130µm)* Width 22.5 µm(19.5 - 25.5µm)* Thickness 1µm(0.5 - 1.5 µm)*

* typical values

Packages Price
HQ:NSC19/No Al-15 15 pcs * 320 USD
320 USD
HQ:NSC19/No Al-50 50 pcs * 900 USD
900 USD
HQ:NSC19/No Al-100 100 pcs * 1700 USD
1700 USD
HQ:NSC19/No Al-200 200 pcs * 3200 USD
3200 USD
HQ:NSC19/No Al-400 400 pcs * 4990 USD
4990 USD
* Total: 0 USD
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